Advances in continuous, in-line processing of stable CdS/CdTe devices

San Diego, CA, USA(2008)

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摘要
A continuous, in-line process suitable for high throughput manufacturing of CdS/CdTe photovoltaic devices has been demonstrated. Utilizing this process, devices with efficiencies of 13% has been fabricated with a low iron soda lime glass (3″×3″) with ant-reflection coatings. The process has been extended to large area devices (16″ ×16″ substrate size). After CdCl2 treatment, devices showed Voc ≫ 700 mV and Jsc ≫ 20 mA/cm2. This performance is similar to the performance of small area devices which showed good stability. Also we have employed Spectroscopic Ellipsometry (SE) as a nondestructive tool to characterize CdS/CdTe heterojunction specifically studying the effects of chemical treatment on the optical properties of the thin-film layers.
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关键词
x ray photoelectron spectroscopy,ellipsometry,ohmic contacts,x ray diffraction,thin film,copper,throughput,photovoltaic systems,stability,oscillators,films,cycle time,high throughput,testing,stress testing,ohmic contact,spectroscopy,glass,environmental testing,iron,heat treatment
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