Indium tin oxide surface topography on monolayer formation and stability
Nanoscience and Nanotechnology（2010）
Abstract
Here we report the effect of Indium tin oxide (ITO) surface structure on the formation of self assembled monolayers (SAM) derived from phosphonohexadecanoic acid with regard to coverage and stability by comparing 2 different ITO surfaces. To ascertain the extent of defects and stability, the electropolymerisation of diaminobenzene onto the monolayer modified ITO surfaces at defect sites and regions where phosphonohexadecanoic acid was poorly bonded. These surfaces were investigated using atomic force microscopy (AFM), electrochemistry and X-ray photoelectron spectroscopy (XPS).
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Key words
X-ray photoelectron spectra,atomic force microscopy,electrochemistry,indium compounds,monolayers,polymerisation,self-assembly,surface topography,AFM,ITO,X-ray photoelectron spectroscopy,XPS,atomic force microscopy,defect sites,diaminobenzene,electrochemistry,electropolymerisation,indium tin oxide surface structure topography,phosphonohexadecanoic acid,self assembled monolayer formation,Indium tin oxide,defects,diaminobenzene,monolayer,
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