Formal Methods for Early Analysis of Functional Reliability in Component-Based Embedded Applications.

Aritra Hazra,Priyankar Ghosh,Satya Gautam Vadlamudi,P. P. Chakrabarti,Pallab Dasgupta

Embedded Systems Letters, IEEE（2013）

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摘要

We present formal methods for determining whether a set of components with given reliability certificates for specific functional properties are adequate to guarantee desired end-to-end properties with specified reliability requirements. We introduce a formal notion for the reliability gap in component-based designs and demonstrate the proposed approach for analyzing this gap using a case study developed around an Elevator Control System.

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关键词

embedded systems,formal verification,reliability,component-based designs,component-based embedded applications,elevator control system,formal methods,functional reliability,reliability certificates,reliability gap,specific functional properties,Design and validation,embedded system,functional reliability,reliability gap

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