High Performance Mixed Signal Circuits Enabled by the Direct Monolithic Heterogeneous Integration of InP HBT and Si CMOS on a Silicon Substrate

Compound Semiconductor Integrated Circuit Symposium(2010)

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摘要
We present recent results on the direct heterogeneous integration of InP HBTs and Si CMOS on a silicon template wafer or SOLES (Silicon On Lattice Engineered Substrate). InP HBTs whose performance are comparable to HBTs on the native InP substrates have been repeatedly achieved. 100% heterogeneous interconnect yield has been achieved on daisy chain test structures with CMOS-InP HBT spacing (interconnect length) as small as 2.5um. In DARPA COSMOS Phase 1 we designed and fabricated a differential amplifier that met the program Go/NoGo metrics with first pass design success. As the COSMOS Phase 2 demonstration vehicle we designed and fabricated a low power dissipation, high resolution, 500MHz bandwidth digital-to-analog converter (DAC).
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关键词
cmos integrated circuits,iii-v semiconductors,differential amplifiers,digital-analogue conversion,heterojunction bipolar transistors,indium compounds,integrated circuit interconnections,mixed analogue-digital integrated circuits,monolithic integrated circuits,silicon,cmos,cosmos phase 2 demonstration vehicle,dac,darpa cosmos phase 1,hbt,inp,soles,bandwidth digital-to-analog converter,daisy chain test structures,differential amplifier,direct heterogeneous integration,direct monolithic heterogeneous integration,heterogeneous interconnect yield,high performance mixed signal circuits,interconnect length,low power dissipation,silicon on lattice engineered substrate,silicon substrate,silicon template wafer,high resolution,heterojunction bipolar transistor
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