Sub-10 fs jitter S-band oscillators and VCOs in a 1×1×0.23 mm3 chip scale package

European Frequency and Time Forum & International Frequency Control Symposium(2013)

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摘要
We present a fourth-design generation Free Running Oscillator and Voltage Controlled Oscillator using integrated bipolar circuitry in the lid wafer with a temperature-compensated FBAR resonator in the base wafer. The goal is to produce a high frequency, low-noise oscillator. Because there are ~15,000 oscillators per wafer, we can develop very sensitive testing procedures to study the oscillator behavior. For example, we have determined our frequency measurement accuracy and precision to be ~ 0.2 parts-per-million (1 σ), and our phase sensitivity floor to be less than -180 dBc/Hz. Measurements on package hermeticity, suggest that the oscillators behave with the same level of integrity as our standard FBAR filters.
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关键词
mmic oscillators,bipolar mmic,chip scale packaging,frequency measurement,jitter,voltage-controlled oscillators,s-band oscillators,vcos,base wafer,chip scale package,fourth-design generation free running oscillator,frequency measurement accuracy,frequency measurement precision,high frequency oscillator,integrated bipolar circuitry,lid wafer,low-noise oscillator,package hermeticity,phase sensitivity floor,temperature-compensated fbar resonator,voltage controlled oscillator,phase noise,resonant frequency,temperature measurement
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