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Random telegraph noise in GaN-based light-emitting diodes

Electronics Letters(2011)

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Abstract
Random telegraph noise (RTN) having two discrete current levels was characterised in reverse current of GaN based light-emitting diodes. Through compared magnitude of the hysteresis with RTN amplitude in reverse current, it is confirmed that RTN causes the current-voltage (I-V) hysteresis. The mechanism of RTN was analysed by using a tunnelling equation. In addition, activation energy of the trap leading to RTN was characterised by analysis of the time constants with voltage and temperature.
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Key words
gallium compounds,hysteresis,light emitting diodes,random noise,wide band gap semiconductors,gan,current-voltage hysteresis,light-emitting diodes,random telegraph noise,reverse current,tunnelling equation
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