Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor

Kenneth A Label,Robert A Gigliuto,Carl M Szabo,M A Carts, Matthew J Kay, Tony Sinclair,Matthew J Gadlage,A L Duncan, D Ingalls

Radiation Effects Data Workshop（2013）

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摘要

Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial motherboards and software stress applications versus more traditional automated test equipment (ATE).

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关键词

cmos integrated circuits,automatic test equipment,hardness testing,integrated circuit testing,radiation hardening (electronics),space vehicle electronics,amd,ate,advanced microdevices,automated test equipment,commercial motherboards,dose rate response,dose rate testing,hardness assurance test,off-shore cmos processor,size 32 nm,software stress applications,testing,central processing unit,stress

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