Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays

A newly constructed solid state silicon dose profile detector is characterized concerning its sensitive profile. The use of the MEDIPIX2 sensor system displays an excellent method to align an image of an X-ray slit to a sample under test. The scanning from front to reverse side of the detector, show a decrease in sensitivity of 20%, which indicates a minority charge carrier lifetime of 0.18 ms and a diffusion length of 460 mu m. The influence of diced edges results in a volumetric efficiency of 59%, an active volume of 1.2 mm(2) of total 2.1 mm(2).