Ultraviolet light emissions from N 2 microplasma electrically induced by metal–insulator–semiconductor devices

Journal of Luminescence, pp. 1073-1075, 2010.

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Abstract:

Various metal–insulator–semiconductor (MIS) devices in the form of Au/SiOx(x<2)/Si, Au/AlOy(y<1.5)/Si, Au/SiOx/ZnO and Au/AlOy/ZnO have been fabricated. For each device, once a sufficiently high positive voltage is applied on the Au electrode, the same ultraviolet (UV) emission with a spectrum featuring several specific peaks is detected....More

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