Robust ESD protection for high brightness GaN LEDs using new TVS Zener diodes

SEMICONDUCTOR SCIENCE AND TECHNOLOGY(2011)

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摘要
The electrostatic discharge (ESD) stability of GaN-based LEDs, which are assembled with new transient voltage suppression (TVS) Zener diodes, has been characterized in experiments on reverse leakage current and functionality. Advantageous features of TVS Zener diodes with extremely low differential resistance and low leakage current have enhanced their ESD protection capability, especially at high temperature. The TVS Zener presented an excellent performance in protecting GaN-based LEDs from ESD stress exceeding the human body model +/- 8 kV at 110 degrees C. The ESD robustness of the high-temperature stability is analyzed in order to provide proper reliability under hostile environment of massive heat and light delivered from LEDs.
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关键词
currents,semiconductor devices,brightness,leakage current,physical properties,stability,electric currents,electrostatic discharge,nitrides
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