Investigation of Electric Fields, Interface Charges, and Conduction Band Offsets at ZnSe/GaAs Heterojunctions with a Novel Photoreflectance Technique

ZnSe/GaAs heterojunctions were investigated by contactless electroreflectance and photoreflectance techniques. Negative surface charge densities on the order of 1012 cm-2 were observed for films grown on n-type GaAs indicating a large contribution to the conduction band barrier between the materials due to band bending. The conduction band offset was also measured using a new photoreflectance technique involving a tunable pump laser.