Functional random instruction testing (FRIT) method for complex devices such as microprocessorsPraveen K Parvathala,Kailasnath Maneparambil,William C Lindsaymag(2005)引用 33|浏览9暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要