FinFET: a mature multi-gate MOS technology ? A wideband transistor simulation and characterization approachJeanpierre Raskin,A Dixit,N Collaert,Tamara Rudenko,Tsung Ming Chung,Denis Flandre,Valeriya Kilchytska,Dimitri Lederermag(2005)引用 22|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要