Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

L. Meng,Steven E. Steen, C. K. Koo,Charanjit S. Bhatia,A.G. Street, Pratik P. Joshi,Young-Hee Kim, Jacob C. H. Phang

photovoltaic specialists conference（2011）

引用 0|浏览8

暂无评分

摘要

Defects in hydrogenated amorphous silicon (a-Si:H) thin-film solar cells were localized by optical beam induced current (OBIC) imaging and then characterized using focused ion beam (FIB) cross-sectioning technique. It was found that nano-voids in the active silicon layer and transparent conductive oxide underneath the back electrode were the main causes of OBIC signal reduction.

查看译文

关键词

transparent conductive oxide,crystal defects,thin film solar cell,cross section,ion beam,silicon,edge detection,imaging,focused ion beam

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要