Particle Size Determination In Electrical Arcs With Ag And Agsno2 Electrodes Using X-Ray Scattering

E. Carvou,J. L. Le Garrec, E. Yee Kin Choi, J. -M. Jouvard,M. Kerkar,J. B. A. Mitchell

PROCEEDINGS OF THE 2015 SIXTY-FIRST IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS (HOLM)（2015）

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摘要

This article discusses recent synchrotron radiation based measurements of nanoparticle formation between arcing contacts. The studied material is typical in contact applications, Ag and AgSnO2.

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关键词

arcs,nanoparticles,X-ray Scattering

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