Characterization of traps in SOI wafers by transconductance characteristics of MOSFETsTatsuro Hanajiri,Yoshikata Nakajima,Hideki Tomita,Kenichi Aoto,Toru Toyabe,Takitaro Morikawa,Takuo Suganomag(2003)引用 23|浏览1暂无评分关键词high frequency,valence bandAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要