High Quality Passive Devices Fabricated Inexpensively In Advanced Rf-Cmos Technologies With Copper Beol

High quality factor inductors and highly matched low capacitance density horizontal parallel plate metal-insulator-metal capacitors were fabricated in 130nm RF-CMOS technology with minimal or zero processing step addition. The high quality factor inductors were made using a novel triple damascene integration technique. Peak quality factor of 26 was demonstrated for a 0.3nH inductor. The low capacitance density MUM capacitors were fabricated using standard BEOL copper planes with zero addition of processing steps. Capacitance density value of 0.66 fF/um(2) was achieved for a six level copper wiring BEOL Impact of copper plane cheesing was characterized to ensure optimal manufacturing production.