Exploiting Multiple Vt and Copper Interconnects
T Mcpherson,R Averill, D Balazich,K Barkley,S Carey,Yiuhing Chan, R Crea, A H Dansky, R Dwyer, A Haen, D E Hoffman, A Jatkowski, Mark Mayo, D Merrill,Timothy Gerard Mcnamara, G A Northrop, J Rawlins,L Sigal,Timothy J Slegel, D A Webber, P R Williams, F Yee mag(2000)
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