A TVSOOPDE Model for Denoising Fringe Pattern in Electronic Speckle Pattern Interferometry

Electronic speckle pattern interferometry (ESPI) is a well-known, nondestructive, whole-field optical technique for measurement. It has been extensively investigated and widely used for deformation measurements in numerous fields. The deformation to be measured is coded in a fringe pattern. Computer-aided fringe analysis can be used for quantitatively evaluating deformation information. However ESPI fringe pattern is contaminated by heavy speckle noise, which makes the fringe analysis difficult.