Improving design manufacturing, and transportation in mass manufacturing through analysis of defect data Timothy J Kostyk, Theresa Kratschmer, Jeff R Layton,Peter K Malkin,Stephen G Perun,Kenneth L Pyra,P Santhanam,John C Thomas, Scott W Wellermag(2012)引用 24|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要