MOSFET matching improvement in 65nm technology providing gain on both analog and SRAM performances
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005.（2005）
关键词
threshold voltage,temperature,nmos,cmos technology,fluctuations,sram,pmos
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要