Statistical study of the degradation of the shielding effectiveness of a structure in the presence of an aperture

A typical electromagnetic (EMC) issue is the determination of the electromagnetic fields inside an enclosure with thin aperture. The solution times of Intermediate Level Circuit Model (ILCM) are three orders of magnitude less than the traditional numerical techniques. The Logistic Regression (LR) algorithm is used to analyze the outputs of the simulation runs. This regression model allows to highlight the most significant independent variables and to predict the performances of the dependent variables when the independent variables are out of the observation ranges.