Detection and Prevention of Palladium Contamination in Silicon DevicesM L Polignano,I Mica, Agostino Brambilla, Claudio Brambilla, Simona Brambilla,Monica Ceresoli,Davide Codegoni, L Farini, F SomainiSolid State Phenomena(2015)引用 0|浏览4暂无评分关键词carrier lifetime,palladium,silicon,contamination,spvAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要