New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization Using Electron Backscatter Diffraction

Journal Article New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction Get access Matthew M Nowell, Matthew M Nowell EDAX Inc., Draper, UT, USA Search for other works by this author on: Oxford Academic Google Scholar Stuart I Wright, Stuart I Wright EDAX Inc., Draper, UT, USA Search for other works by this author on: Oxford Academic Google Scholar Travis Rampton, Travis Rampton EDAX Inc., Mahwah, NJ, USA Search for other works by this author on: Oxford Academic Google Scholar Ryan J Stromberg, Ryan J Stromberg Hysitron Inc., Minneapolis, MN, USA Search for other works by this author on: Oxford Academic Google Scholar Sanjit Bhowmich, Sanjit Bhowmich Hysitron Inc., Minneapolis, MN, USA Search for other works by this author on: Oxford Academic Google Scholar Masateru Shibata, Masateru Shibata JEOL USA Inc., Peabody, MA, USA Search for other works by this author on: Oxford Academic Google Scholar Natasha Erdman Natasha Erdman JEOL USA Inc., Peabody, MA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1173–1174, https://doi.org/10.1017/S1431927615006650 Published: 23 September 2015