Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited CoFeB/MgO/CoFeB Magnetic Tunnel Junctions with Tantalum Capping Layer
Microscopy and Microanalysis（2011）
摘要
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
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