Aggressively Scaled Strained-Silicon-on-Insulator Undoped-Body High- $\kappa$ /Metal-Gate nFinFETs for High-Performance Logic Applications

IEEE Electron Device Letters(2011)

引用 36|浏览57
暂无评分
摘要
Strained-silicon-on-insulator (SSOI) undoped-body high-κ /metal-gate n-channel fin-shaped field-effect transistors (nFinFETs) at scaled gate lengths and pitches (i.e.,LGATE ~ 25 nm and a contacted gate pitch of 130 nm) were fabricated using a gate-first flow. A “long and narrow” fin layout (i.e., fin length ~ 1 μm) was leveraged to preserve uniaxial tensile strain in the transistors. These devices...
更多
查看译文
关键词
Logic gates,Silicon,FinFETs,Substrates,Tensile strain,Performance evaluation
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要