Projectile charge state effects on electron emission in transfer ionization processes

Electron emissions in transfer ionization processes were studied for 75 keV u(-1) He2+, and 80 keV u(-1) Ne8+ on He collisions, using the well-developed reaction microscope techniques. Momentum distributions in the scattering plane, doubly differential distributions as a function of longitudinal momentum and emission angles of the ejected electrons were obtained. An apparent enhancement of electrons distributed around the projectile in the scattering plane was found for the Ne8+ incident case. Furthermore, we report the ratio of doubly differential distributions at the emission angle of 0 degrees between these two transfer ionization processes, in which an abrupt rise is found at and above the electron capture to the continuum peak. This rise qualitatively agrees with the prediction within the framework of Dettmann's theory. We conclude that this kind of enhancement was caused by the charge state effect of the projectile.