Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure

In integrated circuit (IC) burn-in, it is desirable to produce efficient input patterns to assist heating for circuit under test. This study proposes and demonstrates an approach which uses the genetic algorithm incorporating with a BACK-like procedure to generate the patterns which produce the maximal and/or uniform node transition as well as power dissipation for burn-in application. A multi-ste...