A simple Bayes analysis of Weibull Based Accelerated Test model

Rijji Sen,Rakesh Ranjan, S. K. Upadhyay

International Journal of System Assurance Engineering and Management(2015)

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摘要
This paper considers a simple Bayes analysis of a two-parameter Weibull distribution in an accelerated test scenario when the scale parameter is regressed according to power law relationship. The analysis is done using independent, vague priors for the parameters. Experiments involving both complete and censored data sets are assumed from the model. Appropriate numerical illustrations are provided using real datasets. The results are found to be satisfactory.
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关键词
Weibull model,Scale and shape parameters,Accelerated testing,Gibbs sampler,Censored data,Posterior estimates
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