Effects of Contact Placement and Intra/Interlayer Interaction in Current Distribution of Black Phosphorus Sub-10-nm FET

IEEE Transactions on Electron Devices(2017)

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摘要
Black phosphorus (BP) has been proposed as the channel material in the next generation ultrascaled CMOS devices. In order to gain insight into the current characteristics in 2-D layered materials, the current distribution of a few-layer BP Schottky barrier FET is investigated via state-of-the-art quantum device simulations. Approximately 40% of the total current was found to be concentrated in the...
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关键词
Couplings,Current distribution,Silicon,Atomic layer deposition,Logic gates,Current density,Graphene
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