Bayesian degradation modeling for reliability prediction of organic light-emitting diodes

Journal of Computational Science, pp. 117-125, 2016.

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EI

Abstract:

Abstract Simpler degradation models are generally preferred to simplify analytical procedure of failure-time estimation which follows the degradation modeling. However, the luminosity degradation of organic light-emitting diode (OLED) tends to exhibit an initial unstable period followed by stable and more gradual degradation. The degrad...More

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