Accelerated Soft-Error-Rate (SER) Estimation for Combinational and Sequential Circuits
ACM Trans. Design Autom. Electr. Syst., Volume 22, Issue 3, 2017, Pages 57:1-57:21.
EI
Abstract:
Radiation-induced soft errors have posed an increasing reliability challenge to combinational and sequential circuits in advanced CMOS technologies. Therefore, it is imperative to devise fast, accurate and scalable soft error rate (SER) estimation methods as part of cost-effective robust circuit design. This paper presents an efficient SE...More
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