Fast Setpoint Tracking Of An Atomic Force Microscope X-Y Stage Via Optimal Trajectory Tracking

2017 AMERICAN CONTROL CONFERENCE (ACC)(2017)

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摘要
Acquiring Atomic Force Microscope images using compressed sensing requires the piezo X-Y stage to track a sequence of step commands. To achieve fast tracking of such commands requires a precise system model. We show that once such a model is obtained, standard linear feedback can be used to achieve excellent tracking of step inputs. The system under consideration has a significant amount of time delay, and we develop a computationally efficient state estimator for this scenario. We demonstrate that beyond a certain step size threshold, the control law attempts to violate actuator slew-rate limits, resulting in a severely deteriorated response. We then show how this can be overcome by tracking an optimal trajectory obtained by solving a constrained, finite horizon Linear Quadratic Regulator problem and demonstrate the feasibility of this approach experimentally.
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关键词
atomic force microscope images,piezo X-Y stage,atomic force microscope X-Y stage,optimal trajectory tracking,linear quadratic regulator problem
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