Impact Of The Switching Activity On The Aging Of Delay-Pufs

Physically Unclonable Functions (PUFs) are mainly used for generating unique keys to identify electronic devices. The reliability of PUFs needs to be assured under a wide variety of environmental conditions and aging mechanisms. In this paper, we evaluate the impact of NBTI and HCI aging on two types of delay-PUFs (arbiter-PUFs and loop-PUFs). The results show that the switching activity has a limited impact on delay chains and a significant impact on the arbiter (RS latch) of the arbiter-PUF.