WARM: Workload-Aware Reliability Management in Linux/Android.

Pietro Mercati,Francesco Paterna,Andrea Bartolini,Luca Benini,Tajana Simunic Rosing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems（2017）

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摘要

With CMOS scaling beyond 14 nm, reliability is a major concern for IC manufacturers. Reliability-aware design has a non-negligible overhead and cannot account for user experience in mobile devices. An alternative is dynamic reliability management (DRM), which counteracts degradation by adapting the operating conditions at runtime. In this paper, for the first time we formulate DRM as an optimizati...

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关键词

Degradation,Thermal variables control,Program processors,Integrated circuit reliability,Performance evaluation,Negative bias temperature instability

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