Robustness in Automotive Electronics: an Industrial Overview of Major Concerns.

Ulrich Backhausen,Oscar Ballan, Paolo Bernardi,Sergio De Luca,Julie Henzler,Thomas Kern,Davide Piumatti,Thomas Rabenalt,Krishnapriya Chakiat Ramamoorthy,Ernesto Sanchez,Alessandro Sansonetti,Rudolf Ullmann,Federico Venini,Robert Wiesner

IEEE International Symposium on On-Line Testing and Robust System Design（2017）

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摘要

Different perspectives about the concept of Robustness in Automotive Electronic are provides by leading edge semiconductor manufacturer. Xilinx contribution is related to the development and evaluation of Software Test Libraries suitable for in-field testing of the interconnect blocks in large SoCs. Infineon (IFX) section is discussing safety and security concerns of On-Line FLASH Memory Repair. STMicroelectronics is providing guidelines for the development and integration of Core Self-Test libraries.

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关键词

ISO 26262,Functional Safety,SoC On-Line Self-Test,Memory Repair,Security

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