Fabrication Of 3.1kv/10a 4h-Sic Junction Barrier Schottky Diodes

PROCEEDINGS OF 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON ASIC (ASICON)(2015)

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摘要
A 4H-SiC Junction Barrier Schottky Diodes(JBSs) based on 30 ae m, 3x10(15)cm(-3) epitaxial structures was fabricated by using metal Ti as the Schottky metal. The Non-linearly limit field rings (NL-FLRs) is used as termination for protecting the anode edge. The fabricated device shows a breakdown voltage of 3.1kV at reverse leakage current of 200uA and the forward current of 11A at the voltage drop of 3V, corresponding to a current density of 275A/cm(2), of which the on-resistance is 7.3 m Omega center dot cm(2). Finally, the 5266 MW/cm(2) BFOM value of fabricated SiC JBSs is achieved. The results show our fabricated SiC JBSs has an excellent performance.
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关键词
JBS,BFOM value,anode edge,NL-FLR,nonlinearly limit field rings,Schottky metal,epitaxial structures,4H junction barrier Schottky diodes,voltage 3.1 kV,voltage 3 V,current 200 muA,current 11 A,SiC,Ti
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