On Quaternary 1-of-4 ID Generator Circuits.
NASA/ESA Conference on Adaptive Hardware and Systems（2018）
Abstract
A quaternary 1-of-4 ID generator circuit is presented. It exploits the properties of quaternary metastability to provide stable n-bit IDs tolerant to the effects of nanoscale process scaling and temperature variations, which is achieved by increasing the margin between threshold voltage and metastability voltage via quaternary metastability. A 128-bit ID generator hardware implementation and electrical evaluation yields an average of 26.6% uniqueness of ID bits and 100% stability rate over a 10 degrees C to 40 degrees C temperature range.
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Key words
nanoscale process scaling,temperature variations,threshold voltage,metastability voltage,quaternary metastability,ID bits,quaternary 1-of-4 ID generator circuits,ID generator hardware,stability rate,word length 128 bit
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