OLT(RE): An On-Line On-Demand Testing Approach for Permanent Radiation Effects in Reconfigurable Systems.
IEEE Transactions on Emerging Topics in Computing(2018)
摘要
Reconfigurable systems gained great interest in a wide range of application fields, including aerospace, where electronic devices are exposed to a very harsh working environment. Commercial SRAM-based FPGA devices represent an extremely interesting hardware platform for this kind of systems since they combine low cost with the possibility to utilize state-of-the-art processing power as well as the...
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关键词
Field programmable gate arrays,Circuit faults,Performance evaluation,Radiation effects,Reconfigurable devices,Very large scale integration,Fault tolerant systems,Nanotechnology
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