Momentum microscopy on the micrometer scale: Photoemission micro-tomography applied to single molecular domains.

JOURNAL OF PHYSICS-CONDENSED MATTER(2019)

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摘要
Photoemission tomography (PT) is a newly developed method for analyzing angular resolved photoemission data. In combination with momentum microscopy it allows for a comprehensive investigation of the electronic structure of (in particular) metal-organic interfaces as they occur in organic electronic devices. The most interesting aspect in this context is the band alignment, the control of which is indispensable for designing devices. Since PT is based on characteristic photoemission patterns that are used as fingerprints, the method works well as long as these patterns are uniquely representing the specific molecular orbital they are originating from. But this limiting factor is often not fulfilled for systems exhibiting many differently oriented molecules, as they may occur on highly symmetric substrate surfaces. Here we show that this limitation can be lifted by recording the photoemission data in a momentum microscope and limiting the probed surface area to only a few micrometers squared, since this corresponds to a typical domain size for many systems. We demonstrate this by recording data from a single domain of the archetypal adsorbate system 1,4,5,8-naphthalenetetracarboxylic dianhydride on Cu(001). This proof of principle experiment paves the way for establishing the photoemission mu-tomography method as an ideal tool for investigating the electronic structure of metal-organic interfaces with so far unraveled clarity and unambiguity.
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关键词
photoemission tomography,photoemission electron microscopy (PEEM),low energy electron microscopy (LEEM),metal-organic interfaces
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