CMOS-Integrated Low-Noise Junction Field-Effect Transistors for Bioelectronic Applications.

IEEE Electron Device Letters(2018)

引用 19|浏览11
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摘要
In this letter, we present a CMOS-integrated low noise junction field-effect transistor (JFET) developed in a standard 0.18 μm CMOS process. These JFETs reduce input referred flicker noise power by more than a factor of 10 when compared with equally sized n-channel MOS devices by eliminating oxide interfaces in contact with the channel. We show that this improvement in device performance translate...
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关键词
JFETs,Logic gates,Capacitance,Performance evaluation,Transconductance,Capacitance measurement
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