A symmetrical stretching stage for electrical atomic force microscopy

Grzegorz Wielgoszewski,Magdalena Moczała,Karolina Orłowska, Piotr Sówka,Wenzhe Cao,Sigurd Wagner,Teodor Gotszalk

Measurement（2016）

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摘要

•A remotely-controlled device for sample stretching, for use with AFM is proposed.•Symmetrical stretching and releasing of the sample are ensured.•Electrical connections to the sample, enabling KPFM investigations, are provided.

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关键词

Sample stretching,Atomic force microscopy,Kelvin probe force microscopy

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