Investigating Pulsed X-ray Induced SEE in Analog Microelectronic Devices

David Cardoza,Stephen LaLumondiere,Nathan P. Wells,Michael A. Tockstein,Dale Brewe,William T. Lotshaw,Steven C. Moss

IEEE Transactions on Nuclear Science（2015）

引用 12|浏览15

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摘要

We investigate analog single event transient (ASET) generation in an LM124 operational amplifier using focused pulsed x-rays and 800 nm femtosecond laser pulses. We report improvements that have been made to the pulsed x-ray experimental apparatus which include normal incidence geometry and a high speed x-ray chopper that allows us to reduce the pulse repetition frequency of the synchrotron derive...

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关键词

Integrated circuit reliability,Radiation hardening (electronics),Semiconductor device reliability,Single event transients,X-ray applications

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