Impact of Engineered Buried Ti layer on the Memory Performance of HfOx RRAMPang-Shiu Chen, H. Y. Lee,Y. S. Chen,Pei-Yi Gu,Frederick T. Chen, M. J. TsaiThe Japan Society of Applied Physics(2010)引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要