Mapping near-field environments of plasmonic and 2D materials with photo-induced force imaging(Conference Presentation)

We demonstrate the ability to map photo-induced gradient forces in materials, using a setup akin to atomic force microscopy. This technique allows for the simultaneous characterization of topographical features and optical near-fields in materials, with a high spatio-temporal resolution. We show that the near-field gradient forces can be translated onto electric fields, enabling the mapping of plasmonic hot-spots in gold nanostructures, and the resolution of sub-10 nm features in photocatalytic materials. We further show that the dispersion-sensitive nature of near-field gradient forces can be used to image and distinguish atomically thin layers of 2-D materials, with high contrast.