A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an established, highly sensitive analytical technique for mass spectrometry (MS) imaging applications with a lateral resolution below 100 nm. Elemental and molecular information is obtained by bombarding the surface with a focused primary ion beam and analyzing the generated secondary ions in a TOF mass analyzer. Furthermore 3D imaging is possible by employing a lower energetic quasi DC sputter beam for material removal (sputter cycle) and a short pulsed small spot analysis beam for optimal mass spectral and imaging performance (so-called dual beam mode). Application of this technique for the localization of drugs and their metabolites in drug-doped cells could be used to find regions in which a pharmaceutical compound accumulates. This would be extremely helpful for selection of possible drug candidates in pre-clinical studies, thereby reducing the development costs for new pharmaceutical products. Furthermore surveying biologically relevant molecules, like lipids, in tissue can give valuable information on the molecular fundamentals of diseases and the effects of treatments.