Film thickness by interference pattern and optical characterization of polyaniline by spectroscopic ellipsometry

Although Polyaniline (PAni) has been largely studied during several decades, many of its features are still not completely understood. Its optical properties have been widely characterized by simple techniques such as absorbance, transmittance, or reflectance in UV-vis-NIR spectral range, but mathematical model describing its optical properties is still scarce. In this study, spectroscopic ellipsometry was utilized to provide spectral data of PAni thin films. We develop a method for film thickness estimation by analysis of interference pattern and we show a very good-quality fitting to measured data with Tauc-Lorentz model in the spectral range 200-1600 nm. (C) 2016 Elsevier B.V. All rights reserved.