High-Performance Uniaxial Tensile Strained n-Channel JL SOI FETs and Triangular JL Bulk FinFETs for Nanoscaled Applications

IEEE Transactions on Electron Devices(2017)

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摘要
In this paper, one proposed an effective method to enhance current drivability of junctionless FETs (JL-FETs) by utilizing uniaxial tensile strain effects. The strained layers were deposited on JL-FETs on silicon-on-insulator (SOI) and bulk Si wafers, respectively. Strained JL SOI FETs show an extremely low subthreshold swing (S.S.) of 65 mV/decade with ION/IOFF > 109; strained JL bulk FinFETs sho...
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关键词
FinFETs,Logic gates,Tensile strain,Silicon,Doping,Silicon-on-insulator
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