High-Performance Uniaxial Tensile Strained n-Channel JL SOI FETs and Triangular JL Bulk FinFETs for Nanoscaled Applications
IEEE Transactions on Electron Devices(2017)
摘要
In this paper, one proposed an effective method to enhance current drivability of junctionless FETs (JL-FETs) by utilizing uniaxial tensile strain effects. The strained layers were deposited on JL-FETs on silicon-on-insulator (SOI) and bulk Si wafers, respectively. Strained JL SOI FETs show an extremely low subthreshold swing (S.S.) of 65 mV/decade with ION/IOFF > 109; strained JL bulk FinFETs sho...
更多查看译文
关键词
FinFETs,Logic gates,Tensile strain,Silicon,Doping,Silicon-on-insulator
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要