Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light
IEEE Transactions on Electron Devices(2017)
摘要
Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light fr...
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关键词
Light emitting diodes,Temperature measurement,Table lookup,Junctions,Temperature distribution,Modulation
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