Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light

IEEE Transactions on Electron Devices(2017)

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摘要
Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light fr...
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关键词
Light emitting diodes,Temperature measurement,Table lookup,Junctions,Temperature distribution,Modulation
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