An Improved SEL Test of the ADV212 Video Codec

Edward P. Wilcox,Michael J. Campola, Seshagiri R. Nadendla, Madhusudhan Kadari,Robert A. Gigliuto

2017 IEEE Radiation Effects Data Workshop (REDW)（2017）

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摘要

Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latchup (SEL) protection circuitry.

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关键词

Analog Devices ADV212,ADV212 video codec,SEL test,single-event effect test,single-event latchup protection circuitry

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